Creating uniform illumination over a large area makes testing wafer-scale CMOS image sensors tricky, according to San Jose-based Presto Engineering, which has just revealed its computer-controlled solution that illuminates sections of the wafer in turn – working for arrays of large sensors, or even single sensors filling a 12in wafer. “An entire wafer can be ...
This story continues at European test service for CMOS image sensors up to 12in in diameter
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