Friday, March 29, 2019

Hprobe joins with Imec for SOT-MRAM tester development

Hprobe, the two year-old Grenoble provider of  wafer test equipment for magnetic devices,  has joined with Imec to develop advanced magnetic tester equipment for the next generation of MRAM devices based on the Spin Orbit Torque (SOT) effect. Hprobe has begun to optimize the test flow for SOT-MRAM devices in order to bring the characterization and testing to ...

This story continues at Hprobe joins with Imec for SOT-MRAM tester development

Or just read more coverage at Electronics Weekly

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